Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.

ADVANTEST

T5377

T5585

T5371

The ADVANTEST T2000 is a highly versatile test platform with a module architecture, allowing flexible reconfiguration for different applications. It offers a wide range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, enabling comprehensive test coverage at an optimal cost. The T2000's scalability spans from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels. Advantest offers compact solutions for reduced initial investment in development and small lot productions, as well as high-efficiency multiple-DUT parallel measurement solutions for mass productions. The T2000 quickly adapts to market needs with minimal capital investment, making it a preferred choice in the semiconductor industry.

T2000

The ADVANTEST T5588, or T5588 System on Chip (SoC) Tester, is a state-of-the-art semiconductor testing equipment from Advantest Corporation. This advanced system is tailored to conduct thorough testing and verification of integrated circuits (ICs) and SoCs throughout the manufacturing process. With its cutting-edge capabilities, the T5588 ensures high precision and efficiency in semiconductor testing, making it a valuable tool for semiconductor manufacturers seeking top-level performance and reliability.

T5588

The ADVANTEST T5375 is a multi-functional test system designed for memory semiconductors, offering cost-saving benefits for semiconductor manufacturers. It is utilized for both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the ability to test up to 256 devices simultaneously, the T5375 provides efficient and high-throughput testing. The T5375 is specifically focused on capturing an increased market share in front-end DRAM semiconductor testing

T5375

The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types. 

 T5593

The ADVANTEST T2000 LS is a highly versatile test platform with a modular architecture, allowing flexible reconfiguration based on the application's requirements. It offers a diverse range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, ensuring extensive test coverage at an optimal cost. The T2000 LS can be scaled from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels, catering to various testing needs in the semiconductor industry.

T2000 LS

Advantest‘s new T5592 Memory Test System for use in the mass production of Direct Rambus DRAM (D-RDRAM). The T5592 is capable of testing up to 64 devices in parallel and has a testing speed of 1.066 GHz.

T5592

D3186 is a high-performance pulse pattern generator to generate 7 types of pseudo-random (PRBS) patterns from 2(7)-1 to 2(31) -1, programmable (WORD) patterns up to SM 2(23) bits, or frame patterns of SDH or SONET structure at very high speed from 150 Mb/s to 12 Gb/s. Moreover, a system, which is used to evaluate the bit error rate of super-high speed optical communication devices and compound semiconductors, can be structured by combining D3186 with the D3286 error detector.

D3186

T5581H

The T2000 EPP system enables module splitting, in which one module can test multiple devices concurrently. Each device under test (DUT) can be monitored and assessed independently.

T2000 EPP

The ADVANTEST T5377S is a versatile memory test system capable of efficiently and cost-effectively testing a wide range of memory types. This system can handle both traditional and high-speed memory interfaces, making it suitable for various memory testing requirements. With its advanced features and capabilities, the T5377S ensures reliable and accurate testing, optimizing the testing process for memory devices while keeping costs under control.

T5377S

T5335P

The ADVANTEST T5503HS is an advanced semiconductor testing system developed by Advantest Corporation. This system is specifically designed to offer comprehensive testing and verification of high-speed digital and mixed-signal semiconductor devices throughout the manufacturing process. Its sophisticated capabilities ensure precise and reliable testing, making it an essential tool for semiconductor manufacturers seeking top-level performance and quality assurance.

T5503HS

The top-of-the-line device in the T5500 series is the T5501, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductor such as the next generation SGRAM. This model allows twice as much spectrum band to be covered in terms of testing speed as the T5593 and thus enhances the measurement accuracy.

T5501

T6535

D3286

The ADVANTEST T6372 is a test system specifically developed for non-memory semiconductors used in high-definition LCD displays. It enables simultaneous testing of multiple semiconductors for LCD driver integrated circuits, accommodating a total of up to 1,536 pins. 

T6372

T5365P

B6700DES incorporates all capabilities of B6700D into a smaller configuration for engineering purpose. It contributes to a reduced TAT (turn around time) from R&D to device production.

B6700DES

MPT3000ENV

T3347A

T5832

The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.

T6673

B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

B6700S

T5581P

T5334

T6371

The ADVANTEST T2000 IPS (Integrated Power Device Test Solution) is an advanced testing system specifically designed for automotive and power management applications. With its high-performance and high-throughput capabilities, the T2000 IPS efficiently tests various devices used in these industries. This comprehensive solution offers a wide range of feature-rich capabilities, ensuring precise and reliable testing of automotive and power management components. Moreover, the T2000 IPS plays a crucial role in reducing test costs by increasing throughput without compromising on the quality of testing results.

T2000 IPS

The T6577 test systems for SoC semiconductors in the T6500 series are primarily designed to test MCU and SoC semiconductors that control digital consumer products at the production lines. The T6500 series is approximately one-third in size, and uses approximately 50% less power, as compared to Advantest's predecessor product line. Further, the T6500 series operates on a software that is compatible with T6600 series.

T6577

T5372

The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.

T5833

T5335

T5771

HIFIX

The T5383, which is capable of simultaneously testing up to 384 devices and has the same footprint as the T5377S with the capacity to test up to 50% more devices at one time, is a test system with a maximum testing rate is 286 MHz/572 Mbps, which is twice the testing rate for Advantest's previous model.

T5383

T 5771ES

T6672

The ADVANTEST T6373 is an advanced test system featuring a high-speed and precision digitizer along with a DC (LCD ch) test unit configured for per-pin operation. This tester is specifically designed for testing many-pin and precision (10 bit/1024 gradation) driver ICs. Compared to its predecessor, the T6373 achieves an impressive throughput increase of up to 150%. 

T6373

As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.

MPT3000HVM

T5336

B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.

B6700L

The T5586 Memory Test System enables high throughput testing of DDR SDRAMs.

T5586

T6372L

ADVANTEST’s T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test.  Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even higher in parallelism, the T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.

T5385

T5571P

T6575

The T8571 is a test system for non memory semiconductors that is primarily used to evaluate and analyze CCDs that are image sensors. These semiconductors are used in digital consumer products, such as high-resolution digital cameras, mobile phone handset cameras and digital video cameras.

T8571

T5365

T6573

Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.

T5773

B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.

B6700D

Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices.  With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.

T2000 AiR

T8571A	

T5781 Engineering Station (T5781ES), which is designed for evaluation of devices and development of test programs in a developmental / laboratory environment. 

T5781ES

This close cooperation between engineers from Japan and the U.S. is to thank for the success of the Japan and U.S. tester development teams in making it possible for Advantest to ship the T5831ES system designed for next-generation NAND flash memory R&D applications in April 2013, as initially planned.

T5831ES

T5376

T5382

T2000 ISS

T6361

T3347P

T5581

T3332

T5591

T5591R

T3324

T5723ES

T3326A

T5771P

T6575A

T6565A

T5581D

T5331P

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. The T7721 targets highly complex semiconductors used in car electronics and results from the development of Advantest's constituent technology that measures analog signals. The T7721 uses a direct current signal generator with a range of 150V to  64V and utilized up to a maximum of 256 pins, and the T7721 has the capacity to simultaneously measure multiple devices.

T7721

T5378

The ADVANTEST T5375 is a memory semiconductor test system specifically designed for mass production of high-speed memory semiconductors such as DDR3-SDRAM, LPDDR2, and LPDDR3 in the 1 Gbps to 2 Gbps class. 

T5503A

T5723

A new multifunctional memory test system that provides high-speed memory test coverage for diverse next-generation memory chips. The T5835 achieves massive parallelism and test speeds more than double those of previous products, meeting the testing needs of next-generation memory devices with increased speed and capacity.

T5835

T5332P

The T7912 developed based on these device-measuring technologies cultivated in a lapse of long time is an analog test system that supports performance evaluation as well as mass production tests. It will strongly assist customers' businesses enabling high quality tests of excellent cost performance as well.

T7912

T 53P

Memory Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

T5851ES

Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest's second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.

T5503HS2

The ADVANTEST T5503 is the flagship model in the T5500 series, specifically designed for testing and production of ultra high-speed memory semiconductors, including DDR3-SDRAM. This advanced system provides twice the testing speed coverage of the T5501, resulting in enhanced measurement accuracy.

T5503

T7723 test system is for non memory semiconductors for mixed signal integrated circuits. The T7723 targets highly complex semiconductors used in car electronics and is the result of the development of Advantest's constituent technology that measures analog signal. T7723 uses a direct current signal generator with range of 150V to 64V and floating power supply of 60V/10A or 30V/30A (pulse), utilizes up to maximum of 256 pins, and has the capacity to simultaneously measure multiple devices.

T7723

T5363P

H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.

H5620

Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.

MPT3000ES2

T5363

Flash memory semiconductors require more types of front-end testing than other types of semiconductors. Advantest's front-end test system for flash memory semiconductors is the T5724. The T5724 is capable of simultaneously testing up to 2,048 flash memory semiconductors with the Built-in-Self-Test, or BIST, function, which is sixteen times greater than the capability of previous models, and significantly lower test costs. The increase in capability is dues to the T5724's use of a probe card that allows for aggregate wafer contact which increases test speed.

T5724

T3347

The T5761ES retains the same capabilities and functions as the T5761 with a substantially smaller size an at lower testing costs. The T5761ES is capable of simultaneous testing up to 16 devices, evaluation devices in a simplified manner and easily making testing programs available for mass-production. Through the use of the T5761/T5761ES, effective solutions can be structured, from the design of NAND-type flash memory to mass production.

T5761ES

The MPT3000HES and MPT3000HES2 systems offer the same modular hardware, operating software, thermal performance and interfaces as other members of its product family. What distinguishes this tester is a smaller yet highly efficient configuration. The MPT3000HES's and MPT3000HES2's compact size and tester-per-DUT performance make it ideally suited for applications such as low-volume testing and "copy exactly" engineering support for the MPT3000HVM and MPT3000HVM2 production test systems.

MPT3000HES2

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. 

T7722

T6567

With a maximum test speed of 8Gbps, the T5511 is the world's fastest memory testers, supporting the very fastest GDDR5-SDRAM devices with capacity to spare. Furthermore, since all the system's test pins support 8Gbps, no reduction in parallelism occurs when operating at high speed.

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