概述

As portable applications are booming, the global market for flash-memory test systems is projected to continuously grow. Cost-effectively testing these non-volatile memories requires a versatile platform to enable a high return on investment (ROI) and reduce users' financial risk. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories. It uses a scalable, built-in high-current programmable power supply (PPS) architecture that provides the flexibility and economic performance to handle low-pin-count to high-pin-count devices. The system also leverages Advantest's innovative Tester-per-Site™ design. This allows each site to operate independently, enabling very fast test times and lowering the overall cost of test.