概述

The ADVANTEST T5375 is a multi-functional test system designed for memory semiconductors, offering cost-saving benefits for semiconductor manufacturers. It is utilized for both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the ability to test up to 256 devices simultaneously, the T5375 provides efficient and high-throughput testing. The T5375 is specifically focused on capturing an increased market share in front-end DRAM semiconductor testing