概述

The T5761ES retains the same capabilities and functions as the T5761 with a substantially smaller size an at lower testing costs. The T5761ES is capable of simultaneous testing up to 16 devices, evaluation devices in a simplified manner and easily making testing programs available for mass-production. Through the use of the T5761/T5761ES, effective solutions can be structured, from the design of NAND-type flash memory to mass production.