We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 閱讀詳情
ATS 5030
概述
Transform your burn-in testing strategy with the ATS 5030 Burn-in Test (BiT) Platform. The next-generation semiconductor tester offers independent per-site burn-in for semiconductor packaged devices. Deployed globally, the ATS 5030 BiT Platform is a turnkey system that consistently delivers industry-leading thermal stress test for billions of semiconductor devices.
活躍中的上架商品
0
服務
檢驗、保險、評估、物流
最熱門的上架商品
- 未找到產品