描述
Asset Description: Bruker D8 Fabline X-Ray Diffractometer Software Version: XP CIM: NA Process: XRD配置
Hardware Configuration System Type Description Quantity Main System NA Handler System NA Factory Interface NONE Others NA Options System NA Excluded Items List (Pumps, Chillers & Abatement are all excluded) Description Quantity X-Ray generator 1 needs repair/OEM 代工型號說明
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.文檔
無文檔
類別
X-Ray / XRD / XRF
上次驗證: 29 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
141599
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
BRUKER
D8 FABLINE
類別
X-Ray / XRD / XRF
上次驗證: 29 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
141599
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Asset Description: Bruker D8 Fabline X-Ray Diffractometer Software Version: XP CIM: NA Process: XRD配置
Hardware Configuration System Type Description Quantity Main System NA Handler System NA Factory Interface NONE Others NA Options System NA Excluded Items List (Pumps, Chillers & Abatement are all excluded) Description Quantity X-Ray generator 1 needs repair/OEM 代工型號說明
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.文檔
無文檔