The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.

BRUKER

D8 FABLINE

S4 EXPLORER

D2 PHASER

The Bruker D8 DISCOVER is an advanced X-ray diffraction platform with a wide range of applications in high-performance materials research and methodology development. It incorporates state-of-the-art technology, including the unique ability to perform in-plane grazing incidence diffraction (IP-GID). The system serves as a versatile laboratory platform for developing new methodologies that can be seamlessly transferred to the D8 FABLINE tool, enabling smooth implementation in semiconductor fabs.

D8 DISCOVER

D8-GADDS

AXS D8

QUANTAX 200

S2 RANGER

D8 ADVANCE Series II

S2 PUMA

Powder X-ray diffractometer (XRD) used for crystal phase identification, structure determination, and crystallite size analysis

D500

D4 ENDEAVOR

XFLASH-6T160

Automated X-ray defect inspection and metrology system designed for 300 mm silicon semiconductor wafers

JVsensus-600F

NANOSTAR

S8 TIGER

The D2 CRYSOTM is the worldwide first and only benchtop device for a fast X-ray spectroscopic determination of the crystallographic orientation of single crystals applying a patented energy-dispersive method. In addition to the main orientation (surface orientation) the orientation of a second crystallographic direction (flat position, azimuthally orientation) can be determined without changing the position of the analyzed crystal. The measurement and analysis are performed fully automatically after the 
establishment of measurement directives. Thus, the D2 CRYSO is especially suitable for routine measurements connected to the crystal confectioning or the quality control. A process-oriented application of the benchtop system is possible. Crystals can be measured in form of wafers, plates or discs with at least one defined flat surface. The device concept and beam guide allows a simple handling of samples.

D2 CRYSO

S8 FABLINE - T

M4 TORNADO

BRUKER

概述

活躍中的上架商品

全部產品

服務

最熱門的 BRUKER X-Ray / XRD / XRF

D8 FABLINE

S4 EXPLORER

D2 PHASER

D8 DISCOVER

利用 Moov 將其上架並立即找到完美的買家。

所有 BRUKER X-Ray / XRD / XRF