概述

The Bruker D8 DISCOVER is an advanced X-ray diffraction platform with a wide range of applications in high-performance materials research and methodology development. It incorporates state-of-the-art technology, including the unique ability to perform in-plane grazing incidence diffraction (IP-GID). The system serves as a versatile laboratory platform for developing new methodologies that can be seamlessly transferred to the D8 FABLINE tool, enabling smooth implementation in semiconductor fabs.