描述
無描述配置
無配置OEM 代工型號說明
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.文檔
無文檔
類別
Wet Processing / Wafer Cleaning
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
136628
晶圓尺寸:
未知
年份:
12
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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SiPHER
類別
Wet Processing / Wafer Cleaning
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
136628
晶圓尺寸:
未知
年份:
12
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.文檔
無文檔