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ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
描述
Concentration
配置
PL Mapping
OEM 代工型號說明
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
文檔

無文檔

類別
Wet Processing / Wafer Cleaning

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

112393


晶圓尺寸:

12"/300mm


年份:

2000


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ONTO / NANOMETRICS / ACCENT / BIO-RAD

SiPHER

verified-listing-icon
已驗證
類別
Wet Processing / Wafer Cleaning
上次驗證: 超過60天前
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/79d5eeaeb42b417eac372c093e698ccc_ce5f29a791a447b3a24333d4eb27a5dd1201a_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/616d754d2a26498193cf8a43a935355e_18c07cac3f414bf19d4a04b520253c14_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/ad8a4b9e8ce6424bb7e9b4378ba742a8_6e337e5ff7324e2680f02dbddc1d92a2_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/53add12bc4f54bffab3aa2214846cb7c_a1a4151c1e2a413694afd4e90f7ce79f_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/e9c219cb9b0e4474923724dc7ca8e745_65299a9cfa6c473792fe7548b6693f48_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/8ab6f6ba087341dbb42cdfecfab812b7_f0bda36d8cd84c20966a53ac397def151201a_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/0c49f68932dc44baa801aef0e0f47666_bbb3fda6fe47402582c5e5f9f07a744f_mw.jpeg
listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/f8fa53dea6ca4225ac6e97bb236a86bb_797e8b22fec343498bf4fa281ece09671201a_mw.jpeg
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

112393


晶圓尺寸:

12"/300mm


年份:

2000


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Concentration
配置
PL Mapping
OEM 代工型號說明
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
文檔

無文檔