SiPHER
概述
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
活躍中的上架商品
4
服務
檢驗、保險、評估、物流
最熱門的上架商品
ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份: 2000條件: 二手上次驗證超過60天前ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份: 條件: 二手上次驗證29 天前ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份: 12條件: 二手上次驗證超過30天前ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份: 2002條件: 二手上次驗證超過60天前
