描述
無描述配置
The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) ImagingOEM 代工型號說明
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JEOL
JSM 7000F
已驗證
類別
SEM / FIB
上次驗證: 今日
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
117400
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM 7000F
類別
SEM / FIB
上次驗證: 今日
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
117400
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) ImagingOEM 代工型號說明
未提供文檔
無文檔