跳到主要內容
Moov logo

Moov Icon
JEOL JSM 7000F
    描述
    無描述
    配置
    The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    verified-listing-icon

    已驗證

    類別
    SEM / FIB

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    117400


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    JEOL

    JSM 7000F

    verified-listing-icon
    已驗證
    類別
    SEM / FIB
    上次驗證: 超過60天前
    listing-photo-c505d5f4dcea4dd2bf279a9a005cdeb6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/48780/c505d5f4dcea4dd2bf279a9a005cdeb6/9ec64efe81344af9ad9c815c79e93642_jeoljsm7000finuse_mw.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    117400


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
    OEM 代工型號說明
    未提供
    文檔

    無文檔