描述
Imaging Resolution (SEM-mode): 1.2 nm 30kv 1.5 nm 15kv 3.0 nm 1kv Magnification Range: 10X-500,000X Deben PCD Beam Blanking System Beam Current 10pA-200nA Computer controlled large eucentric specimen stage Nabity's Nanometer Pattern Generation System V9.0 Thermal FE SEM.配置
無配置OEM 代工型號說明
未提供文檔
無文檔
JEOL
JSM 7000F
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
134592
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Imaging Resolution (SEM-mode): 1.2 nm 30kv 1.5 nm 15kv 3.0 nm 1kv Magnification Range: 10X-500,000X Deben PCD Beam Blanking System Beam Current 10pA-200nA Computer controlled large eucentric specimen stage Nabity's Nanometer Pattern Generation System V9.0 Thermal FE SEM.配置
無配置OEM 代工型號說明
未提供文檔
無文檔