描述
Docked Teradyne Tester IP750EP, J750EX SACC (cart move type) Hot Chuck (Nickel) Needle Cleaning Unit (150mm x 150mm) GPIB interface Temperature range : based on the configuration. (Hot only)配置
無配置OEM 代工型號說明
Precio nano™ is a 300mm wafer prober that realizes high accuracy contact and cleanness under high load. In the probing process, demand for probing technology has diversified as process miniaturization, high function/high integration devices and packages are changing.文檔
無文檔
類別
Probers
上次驗證: 14 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
137149
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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TEL / TOKYO ELECTRON
PRECIO NANO
類別
Probers
上次驗證: 14 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
137149
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Docked Teradyne Tester IP750EP, J750EX SACC (cart move type) Hot Chuck (Nickel) Needle Cleaning Unit (150mm x 150mm) GPIB interface Temperature range : based on the configuration. (Hot only)配置
無配置OEM 代工型號說明
Precio nano™ is a 300mm wafer prober that realizes high accuracy contact and cleanness under high load. In the probing process, demand for probing technology has diversified as process miniaturization, high function/high integration devices and packages are changing.文檔
無文檔