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TEL / TOKYO ELECTRON P-12XLn
    描述
    Cleaning Unit size tester I/F loader: 230*155
    配置
    ( Tri-Temp ) prober
    OEM 代工型號說明
    The P-12XLn is a next-generation wafer prober developed for 300mm testing. It is part of the P-12XL series, which also includes the P-12XL, P-12XLn+, and P-12XLm models. The P-12XLn retains the acclaimed on-axis alignment feature of previous models while being able to handle reduced pad size. The system assures high-accuracy probing under both high and low temperature conditions, thanks to its hot and cold temperature, heat dissipation thermal systems. Additionally, the P-12XLn’s rigid deflection-resistant stage can handle higher pin counts with lower mechanical deflection. Other features of the P-12XLn include an automation system, equipment standardization, clean technology, PC-aided product file management and remote operation, and software compatibility with the P-8 series probers. The P-12XLn is capable of handling CIM/FA, such as AMHS, and can measure wafer sizes of 300mm, 200mm, and 150mm (option).
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    已驗證

    類別
    Probers

    上次驗證: 5 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    142230


    晶圓尺寸:

    未知


    年份:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    TEL / TOKYO ELECTRON P-12XLn

    TEL / TOKYO ELECTRON

    P-12XLn

    Probers
    年份: 2003條件: 二手
    上次驗證5 天前

    TEL / TOKYO ELECTRON

    P-12XLn

    verified-listing-icon
    已驗證
    類別
    Probers
    上次驗證: 5 天前
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    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    142230


    晶圓尺寸:

    未知


    年份:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Cleaning Unit size tester I/F loader: 230*155
    配置
    ( Tri-Temp ) prober
    OEM 代工型號說明
    The P-12XLn is a next-generation wafer prober developed for 300mm testing. It is part of the P-12XL series, which also includes the P-12XL, P-12XLn+, and P-12XLm models. The P-12XLn retains the acclaimed on-axis alignment feature of previous models while being able to handle reduced pad size. The system assures high-accuracy probing under both high and low temperature conditions, thanks to its hot and cold temperature, heat dissipation thermal systems. Additionally, the P-12XLn’s rigid deflection-resistant stage can handle higher pin counts with lower mechanical deflection. Other features of the P-12XLn include an automation system, equipment standardization, clean technology, PC-aided product file management and remote operation, and software compatibility with the P-8 series probers. The P-12XLn is capable of handling CIM/FA, such as AMHS, and can measure wafer sizes of 300mm, 200mm, and 150mm (option).
    文檔

    無文檔

    類似上架商品
    查看全部
    TEL / TOKYO ELECTRON P-12XLn

    TEL / TOKYO ELECTRON

    P-12XLn

    Probers年份: 2003條件: 二手上次驗證:5 天前
    TEL / TOKYO ELECTRON P-12XLn

    TEL / TOKYO ELECTRON

    P-12XLn

    Probers年份: 2004條件: 二手上次驗證:9 天前
    TEL / TOKYO ELECTRON P-12XLn

    TEL / TOKYO ELECTRON

    P-12XLn

    Probers年份: 2004條件: 二手上次驗證:6 天前