描述
Product Title: LTX-Credence Main Logic/Controller Board – P/N 671-7606-00 • Manufacturer: LTX-Credence (Cohu) • Compatibility: Designed for Sapphire or Diamond series ATE (Automated Test Equipment).配置
Technical Details: • Processing Power: Features 6x Xilinx Virtex-II Pro FPGAs (XC2VP70 or similar) for massive parallel signal processing. • Board Revision: Assembly No. 671-7606-00 Rev B. • Architecture: Multi-layered PCB with integrated PowerPC RISC processor blocks (within FPGAs) and dedicated 18-bit multipliers. • Interface: High-speed backplane connector for communication with tester instrument blades.OEM 代工型號說明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文檔
無文檔
類別
Final Test
上次驗證: 8 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
144988
晶圓尺寸:
未知
Config / Diag File:
Yes
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / LTX-CREDENCE
SAPPHIRE
類別
Final Test
上次驗證: 8 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
144988
晶圓尺寸:
未知
Config / Diag File:
Yes
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Product Title: LTX-Credence Main Logic/Controller Board – P/N 671-7606-00 • Manufacturer: LTX-Credence (Cohu) • Compatibility: Designed for Sapphire or Diamond series ATE (Automated Test Equipment).配置
Technical Details: • Processing Power: Features 6x Xilinx Virtex-II Pro FPGAs (XC2VP70 or similar) for massive parallel signal processing. • Board Revision: Assembly No. 671-7606-00 Rev B. • Architecture: Multi-layered PCB with integrated PowerPC RISC processor blocks (within FPGAs) and dedicated 18-bit multipliers. • Interface: High-speed backplane connector for communication with tester instrument blades.OEM 代工型號說明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文檔
無文檔