描述
無描述配置
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEM 代工型號說明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文檔
無文檔
類別
Final Test
上次驗證: 8 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
144985
晶圓尺寸:
未知
Config / Diag File:
No
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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SAPPHIRE
類別
Final Test
上次驗證: 8 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
144985
晶圓尺寸:
未知
Config / Diag File:
No
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEM 代工型號說明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文檔
無文檔