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COHU / LTX-CREDENCE SAPPHIRE
    描述
    Tester
    配置
    無配置
    OEM 代工型號說明
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    文檔

    無文檔

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon

    已驗證

    類別
    Final Test

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    106704


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test
    年份: 2007條件: 二手
    上次驗證超過60天前

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon
    已驗證
    類別
    Final Test
    上次驗證: 超過60天前
    listing-photo-b641c826db28423787694b0c7aa4fdd1-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    106704


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Tester
    配置
    無配置
    OEM 代工型號說明
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    文檔

    無文檔

    類似上架商品
    查看全部
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test年份: 2007條件: 二手上次驗證:超過60天前
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test年份: 0條件: 二手上次驗證:超過60天前
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test年份: 0條件: 二手上次驗證:超過30天前