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ADVANTEST T5593
    描述
    SPARE BOARD
    配置
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    OEM 代工型號說明
    The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types.
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    類別
    Final Test

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    129273


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    ADVANTEST

    T5593

    verified-listing-icon
    已驗證
    類別
    Final Test
    上次驗證: 超過30天前
    listing-photo-7ca566d94c834b869a289688c9342071-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    129273


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    SPARE BOARD
    配置
    無配置
    OEM 代工型號說明
    The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types.
    文檔

    無文檔