描述
Advantest T5593 (complete system with host) Equipped with 2 ALPG's (Algorithmic Pattern Generator)配置
DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD NUMBER OF TEST HEAD [1,2] ..........................> 1 CONFIGURATION OF TEST HEAD 1 (0:NOT EXIST 1:NORMAL BOARD 2:HSC BOARD) 1 1 1 1 1 1 1 2 2 2 2 3 3 4 5 9 0 0 1 6 6 7 7 2 3 3 4 3 9 5 1 7 3 9 5 1 7 3 9 5 1 7 3 A A A A A A A A A A A A A A A A CHILD A1 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 CHILD A3 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1- 64] ...........> 1-32 10V PPS CONFIGURATION [1-320] ...........> 1-128 AC FREQUENCY (Hz) [50,60] ...........> 60 CONFIGURATION OF ALPG SUBALPG OPTION EXIST [Y,N] .........................> YES CONFIGURATION OF PDS SUFFIX OF PDSDR [1:NONE,2:X02] .....................> 2 CONFIGURATION OF DBM DBM OPTION EXIST [Y,N] .............................> NO CONFIGURATION OF FM NUMBER OF FM BOARD [0,2,4,8] ........................> 0 CONFIGURATION OF SC DQS ANALIZER OPTION EXIST [Y,N] ....................> NO END SAVEOEM 代工型號說明
The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types.文檔
類似上架商品
查看全部
ADVANTEST
T5593
類別
Final Test
上次驗證: 30 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
128490
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available