描述
Metrology / inspection system配置
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEM 代工型號說明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文檔
無文檔
類別
Defect Inspection
上次驗證: 5 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
154786
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
SEMVISION G2
類別
Defect Inspection
上次驗證: 5 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
154786
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Metrology / inspection system配置
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEM 代工型號說明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文檔
無文檔