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APPLIED MATERIALS (AMAT) SEMVISION G2
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
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    APPLIED MATERIALS (AMAT)

    SEMVISION G2

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    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    108850


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection
    年份: 2004條件: 二手
    上次驗證超過60天前

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-4e70c292ed7c4078871490d84029ee65-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    108850


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
    文檔

    無文檔

    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection年份: 2004條件: 二手上次驗證:超過60天前
    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前