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APPLIED MATERIALS (AMAT) SEMVISION G2
  • APPLIED MATERIALS (AMAT) SEMVISION G2
  • APPLIED MATERIALS (AMAT) SEMVISION G2
  • APPLIED MATERIALS (AMAT) SEMVISION G2
描述
無描述
配置
無配置
OEM 代工型號說明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
文檔

無文檔

類別
Defect Inspection

上次驗證: 超過30天前

關鍵商品詳情

條件:

Parts Tool


作業狀態:

未知


產品編號:

129232


晶圓尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

APPLIED MATERIALS (AMAT)

SEMVISION G2

verified-listing-icon
已驗證
類別
Defect Inspection
上次驗證: 超過30天前
listing-photo-2f8fdcf94ed241d1b656e8fe653169d7-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
關鍵商品詳情

條件:

Parts Tool


作業狀態:

未知


產品編號:

129232


晶圓尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
無配置
OEM 代工型號說明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
文檔

無文檔