描述
無描述配置
無配置OEM 代工型號說明
Automated X-ray defect inspection and metrology system designed for 300 mm silicon semiconductor wafers文檔
無文檔
類別
X-Ray / XRD / XRF
上次驗證: 昨日
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
158707
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
BRUKER
JVsensus-600F
類別
X-Ray / XRD / XRF
上次驗證: 昨日
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
158707
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
Automated X-ray defect inspection and metrology system designed for 300 mm silicon semiconductor wafers文檔
無文檔