描述
Atomic force microscope配置
無配置OEM 代工型號說明
Powder X-ray diffractometer (XRD) used for crystal phase identification, structure determination, and crystallite size analysis文檔
無文檔
BRUKER
D500
類別
X-Ray / XRD / XRF
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
155204
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Atomic force microscope配置
無配置OEM 代工型號說明
Powder X-ray diffractometer (XRD) used for crystal phase identification, structure determination, and crystallite size analysis文檔
無文檔