跳到主要內容
Moov logo

Moov Icon
BRUKER D8 FABLINE
    描述
    X-ray diffractometer
    配置
    Software Version: 77-2.3A-6A-5A-5A-RR6A CIM: E84, SECS/GEM, GEM300 Factory interface: (Qty 2) FOUP Options system: Primary optics for micro diffraction, TSX X-ray system LynxEye detector for secondary side with mount Keyence laser triangulation module for fast height alignment Pattern recognition software Wafer chuck Handler system: Standard automation and software
    OEM 代工型號說明
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    文檔

    無文檔

    verified-listing-icon

    已驗證

    類別
    X-Ray / XRD / XRF

    上次驗證: 12 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    152882


    晶圓尺寸:

    12"/300mm


    年份:

    2015


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRF
    年份: 2008條件: 二手
    上次驗證超過60天前

    BRUKER

    D8 FABLINE

    verified-listing-icon
    已驗證
    類別
    X-Ray / XRD / XRF
    上次驗證: 12 天前
    listing-photo-60ab6747318248f78b71350b212c799f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/90238/60ab6747318248f78b71350b212c799f/95d68b3a017a4ad69d1844b350043012_1_mw.jpg
    listing-photo-60ab6747318248f78b71350b212c799f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/90238/60ab6747318248f78b71350b212c799f/e28708747b334ff98c2b3e9cac33cfc9_2_mw.jpg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    152882


    晶圓尺寸:

    12"/300mm


    年份:

    2015


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    X-ray diffractometer
    配置
    Software Version: 77-2.3A-6A-5A-5A-RR6A CIM: E84, SECS/GEM, GEM300 Factory interface: (Qty 2) FOUP Options system: Primary optics for micro diffraction, TSX X-ray system LynxEye detector for secondary side with mount Keyence laser triangulation module for fast height alignment Pattern recognition software Wafer chuck Handler system: Standard automation and software
    OEM 代工型號說明
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    文檔

    無文檔

    類似上架商品
    查看全部
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRF年份: 2008條件: 二手上次驗證:超過60天前
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRF年份: 2015條件: 二手上次驗證:12 天前
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRF年份: 2019條件: 二手上次驗證:6 天前