描述
無描述配置
無配置OEM 代工型號說明
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers文檔
無文檔
N & K
3300
類別
Thin Film / Film Thickness
上次驗證: 3 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
153189
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers文檔
無文檔