3300
概述
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers
活躍中的上架商品
1
服務
檢驗、保險、評估、物流
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers
1
檢驗、保險、評估、物流
