描述
Wafer thickness measurement system配置
無配置OEM 代工型號說明
The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.文檔
無文檔
類別
Thin Film / Film Thickness
上次驗證: 4 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
153161
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FSM / FRONTIER SEMICONDUCTOR
FSM 413
類別
Thin Film / Film Thickness
上次驗證: 4 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
153161
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Wafer thickness measurement system配置
無配置OEM 代工型號說明
The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.文檔
無文檔