FSM / FRONTIER SEMICONDUCTOR

FSM128LC2C	

FSM-128

500TC

128NT

900TC

AQUAFLEX

900TC-VAC	

The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.

FSM 413

Micro Raman system  for lattice level strain and material composition measurement. High spectral resolution (0.02 cm-1) and sub micron lateral resolution. Measurement of through silicon via (TSV) keep out zone, local stress and composition profiling.  Fully automated C2C system.

RAMAN 360

Thickness and total thickness variation (TTV) mapping system. TTV and Thickness of wafer substrate, thick layers, wafers on tape, bonded wafers, etc. Fully automated cassette to cassette system, SECS/GEM compliant. Warp, Roughness, and Thin Film Thickness measurement options.

413 C2C

Local and Lattice Stress Measurement, Die level Topography. For in-die and in-device stress and composition control.

FSM127

Film stress and wafer bow measurement for wafers up to 300mm diameter. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.

FSM / FRONTIER SEMICONDUCTOR

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最熱門的 FSM / FRONTIER SEMICONDUCTOR Thin Film / Film Thickness

FSM128LC2C

FSM-128

500TC

128NT

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所有 FSM / FRONTIER SEMICONDUCTOR Thin Film / Film Thickness