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RAMAN 360
概述
Micro Raman system for lattice level strain and material composition measurement. High spectral resolution (0.02 cm-1) and sub micron lateral resolution. Measurement of through silicon via (TSV) keep out zone, local stress and composition profiling. Fully automated C2C system.
活躍中的上架商品
1
服務
檢驗、保險、評估、物流
