描述
無描述配置
無配置OEM 代工型號說明
The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.文檔
無文檔
類別
Thin Film / Film Thickness
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
102285
晶圓尺寸:
未知
年份:
2013
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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Thin Film / Film Thickness年份: 2013條件: 二手
上次驗證超過60天前
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 9100
類別
Thin Film / Film Thickness
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
102285
晶圓尺寸:
未知
年份:
2013
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.文檔
無文檔