描述
Ox film thickness measurement( PC missing)配置
無配置OEM 代工型號說明
The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.文檔
無文檔
類別
Thin Film / Film Thickness
上次驗證: 13 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
144578
晶圓尺寸:
8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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類別
Thin Film / Film Thickness
上次驗證: 13 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
144578
晶圓尺寸:
8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Ox film thickness measurement( PC missing)配置
無配置OEM 代工型號說明
The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.文檔
無文檔