描述
無描述配置
無配置OEM 代工型號說明
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.文檔
無文檔
JEOL
JEM-3010
已驗證
類別
TEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
69539
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JEM-3010
類別
TEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
69539
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.文檔
無文檔