概述

The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.