描述
FE Sem with Horriba EMAX EDX配置
FE Sem with Horriba EMAX EDX Windows 2000 based system TYPE 2 Stage - Motorized stage system 17 inch LCD monitor Pentium 4 control PC System detail : Main body - 1 Display unit - 1 Power rack - 1 IP power rack - 1 Rotary pump - 2 Weight and vacuum hose - 1 Option: Chamber cameraOEM 代工型號說明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.文檔
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HITACHI
S-4700 II
已驗證
類別
SEM
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
76064
晶圓尺寸:
12"/300mm
年份:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-4700 II
已驗證
類別
SEM
上次驗證: 16 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
76064
晶圓尺寸:
12"/300mm
年份:
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
FE Sem with Horriba EMAX EDX配置
FE Sem with Horriba EMAX EDX Windows 2000 based system TYPE 2 Stage - Motorized stage system 17 inch LCD monitor Pentium 4 control PC System detail : Main body - 1 Display unit - 1 Power rack - 1 IP power rack - 1 Rotary pump - 2 Weight and vacuum hose - 1 Option: Chamber cameraOEM 代工型號說明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.文檔
無文檔