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HITACHI S-4700 II
    描述
    (FE-SEM)
    配置
    Resolution: 15kv : 1.5nm 1kv : 2.5nm Magnification High mode: 30x ~ 500,000x Maximum angle: 45 degrees Stage move: X,Y,Z,T,R : Motorizing Sample exchange time: About 30 seconds
    OEM 代工型號說明
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
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    HITACHI

    S-4700 II

    verified-listing-icon

    已驗證

    類別
    SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    111323


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM
    年份: 2001條件: 二手
    上次驗證超過60天前

    HITACHI

    S-4700 II

    verified-listing-icon
    已驗證
    類別
    SEM
    上次驗證: 超過60天前
    listing-photo-87a24057349f4beb897cc3e17954dfc8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/79856/87a24057349f4beb897cc3e17954dfc8/a24de41e1dd0454a893c0f256e3ae294_s4700_mw.jpg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    111323


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    (FE-SEM)
    配置
    Resolution: 15kv : 1.5nm 1kv : 2.5nm Magnification High mode: 30x ~ 500,000x Maximum angle: 45 degrees Stage move: X,Y,Z,T,R : Motorizing Sample exchange time: About 30 seconds
    OEM 代工型號說明
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    文檔

    無文檔

    類似上架商品
    查看全部
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM年份: 2001條件: 二手上次驗證:超過60天前
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM年份: 0條件: 二手上次驗證:超過60天前
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM年份: 0條件: 翻新的上次驗證:超過60天前