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HITACHI S-4700 I
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
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    HITACHI

    S-4700 I

    verified-listing-icon

    已驗證

    類別
    SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    104040


    晶圓尺寸:

    未知


    年份:

    2002


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEM
    年份: 2001條件: 二手
    上次驗證超過60天前

    HITACHI

    S-4700 I

    verified-listing-icon
    已驗證
    類別
    SEM
    上次驗證: 超過60天前
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/6667bce67b8a4ef6baff8431891dad6c_140fd0d9208a48bd919a19e736ca60511201a_mw.jpeg
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/316df38601b94b56924986c3a6346ab0_156c2b3162e54c3296ec7af9736bb3c11201a_mw.jpeg
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/b09e1a8e27f446fc86e022d0f3992319_fcb6f3398b064dc9a056f244131966211201a_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    104040


    晶圓尺寸:

    未知


    年份:

    2002


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
    文檔

    無文檔

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    查看全部
    HITACHI S-4700 I

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    S-4700 I

    SEM年份: 2001條件: 二手上次驗證:超過60天前
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    HITACHI S-4700 I

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    SEM年份: 2011條件: 二手上次驗證:超過60天前