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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon

    已驗證

    類別
    SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    105387


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM
    年份: 0條件: 二手
    上次驗證超過60天前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon
    已驗證
    類別
    SEM
    上次驗證: 超過60天前
    listing-photo-b9813c49e80c49fda840d82a20a8f56f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    105387


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
    文檔

    無文檔

    類似上架商品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM年份: 0條件: 二手上次驗證:超過60天前