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描述
無描述配置
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEM 代工型號說明
未提供文檔
無文檔
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Idle
產品編號:
102936
晶圓尺寸:
6"/150mm
年份:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
1560
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Idle
產品編號:
102936
晶圓尺寸:
6"/150mm
年份:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEM 代工型號說明
未提供文檔
無文檔