描述
Details Attached配置
FA SEMs/TEMs/Dual Beams Specification: Secondary electron image resolution: 0.8 nm @ 15kV 1.4 nm @ 1kV 0.6 nm @ 30kV STEM Mode 3.0 nm @ 20Kv at 10nA WD = 8.5nm Magnification: 12 – 2,000,000X Specimen Stage: Stage Motorization: 5 Axis Stage Motorization X = 130mm, Y = 130mm, Z = 50mm, T = -3 to 70 deg, R = 360 deg Configuration: Operating System: Windows XP Pro BSD STEM Load Lock Motorized Stage Smart SEM Version 5.07 Oxford EDX 50mm Sq detector XEI Plasma CleanerOEM 代工型號說明
未提供文檔
類別
SEM / FIB
上次驗證: 昨日
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
148922
晶圓尺寸:
未知
年份:
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
MERLIN
類別
SEM / FIB
上次驗證: 昨日
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
148922
晶圓尺寸:
未知
年份:
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available