描述
Asset Description - Focus Ion Beam Mill Software Version - Windows CIM - NONE Process - Focus Ion Beam Mill Fab Section - Test Excluded Items List (Pumps, Chillers & Abatement are all excluded)配置
System Type Description Quantity Main System FIB tool designed for Packaging and Deep cuts 1 Factory Interface NONE Options System Others Handler System ManualOEM 代工型號說明
The Orion NanoFab Helium Ion Microscope (HIM) operates using ionized Helium or Neon gases rather than electrons for imaging and milling of materials. Helium is typically used for imaging and milling very thin films (e.g. graphene), with a spot size ~0.5 nm. Neon is is heavier, and thus better adapted for milling bulk materials and thin films with a spot size of ~2 nm.文檔
類別
SEM / FIB
上次驗證: 15 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
136497
晶圓尺寸:
8"/200mm
年份:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
ORION NanoFab
類別
SEM / FIB
上次驗證: 15 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
136497
晶圓尺寸:
8"/200mm
年份:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available