描述
The lower portion of the FIB column needs to be replaced Dem column is functional but there's noise in the image Magnification range: 1000kX Detectors: SE In-Beam SE BSE Process: PCB / C4 Operating system: Windows 10 Pro配置
無配置OEM 代工型號說明
未提供文檔
無文檔
TESCAN
XEIA 3
類別
SEM / FIB
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
138441
晶圓尺寸:
8"/200mm
年份:
2016
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
The lower portion of the FIB column needs to be replaced Dem column is functional but there's noise in the image Magnification range: 1000kX Detectors: SE In-Beam SE BSE Process: PCB / C4 Operating system: Windows 10 Pro配置
無配置OEM 代工型號說明
未提供文檔
無文檔