描述
Performance Resolution: 6 nm (30 kV, WD = 8 mm, secondary electron image). Magnification: 15x (WD = 48 mm) 200,000x, provided with an automatic magnification correction device. Imaging signals: Secondary electrons, backscattered electrons.配置
SEM system, JEOL JSM T300 electron microscope.OEM 代工型號說明
未提供文檔
JEOL
JSM-T300
類別
SEM / FIB
上次驗證: 今日
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Idle
產品編號:
150627
晶圓尺寸:
未知
年份:
1
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available