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JEOL JSM-IT700HR
    描述
    JEOL scanning electron microscope Magnification range: 5x – 600,000x Acceleration voltage: 0.5 – 30 kV Patented InLens Schottky emitter. Dual condenser system for loss-free electron extraction. Continuous beam current adjustment without aperture change. Maximum beam current up to over 300 nA. Optimized specimen chamber geometry for imaging and analytics. Fully motorized heavy-duty specimen stage with eucentric tilt and rotation for samples up to 20 cm Ø and 2 kg weight. Travel ranges: X: 125 mm, Y: 100 mm, Z: 80 mm, T: -10° ~ 90°, R: 360°. Secondary electron detector. Energy-filtered SE detection (REF mode). Fully automatic switching between high and low vacuum range via software without aperture adjustment. Image storage up to 5,120 x 3,840 pixels. Image acquisition up to over 100,000 x 100,000 pixels. Automatic pumping system with turbopump and ultra-quiet fore-vacuum pump. PC hardware-independent and fully remote-operable user software. Compact footprint: 0.78 m². Integrated compressed air damping system. Low-maintenance system without water cooling and nitrogen. Castors for mobile use. Backscattered electron detector. Workstation with Windows 10. 23" monitor. Keyboard/mouse set.
    配置
    無配置
    OEM 代工型號說明
    未提供
    文檔

    無文檔

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    已驗證

    類別
    SEM / FIB

    上次驗證: 2 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    150300


    晶圓尺寸:

    未知


    年份:

    2023


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    JEOL JSM-IT700HR

    JEOL

    JSM-IT700HR

    SEM / FIB
    年份: 2023條件: 二手
    上次驗證2 天前

    JEOL

    JSM-IT700HR

    verified-listing-icon
    已驗證
    類別
    SEM / FIB
    上次驗證: 2 天前
    listing-photo-393b93cdc4e24723908ac942bd1be201-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    150300


    晶圓尺寸:

    未知


    年份:

    2023


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    JEOL scanning electron microscope Magnification range: 5x – 600,000x Acceleration voltage: 0.5 – 30 kV Patented InLens Schottky emitter. Dual condenser system for loss-free electron extraction. Continuous beam current adjustment without aperture change. Maximum beam current up to over 300 nA. Optimized specimen chamber geometry for imaging and analytics. Fully motorized heavy-duty specimen stage with eucentric tilt and rotation for samples up to 20 cm Ø and 2 kg weight. Travel ranges: X: 125 mm, Y: 100 mm, Z: 80 mm, T: -10° ~ 90°, R: 360°. Secondary electron detector. Energy-filtered SE detection (REF mode). Fully automatic switching between high and low vacuum range via software without aperture adjustment. Image storage up to 5,120 x 3,840 pixels. Image acquisition up to over 100,000 x 100,000 pixels. Automatic pumping system with turbopump and ultra-quiet fore-vacuum pump. PC hardware-independent and fully remote-operable user software. Compact footprint: 0.78 m². Integrated compressed air damping system. Low-maintenance system without water cooling and nitrogen. Castors for mobile use. Backscattered electron detector. Workstation with Windows 10. 23" monitor. Keyboard/mouse set.
    配置
    無配置
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    類似上架商品
    查看全部
    JEOL JSM-IT700HR

    JEOL

    JSM-IT700HR

    SEM / FIB年份: 2023條件: 二手上次驗證:2 天前