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JEOL JSM-5800LV
    描述
    turbo pumped, 5 axis motorized stage, SE and backscatter detectors, medium sized chamber, tungsten filament, variable pressure/low vacuum
    配置
    無配置
    OEM 代工型號說明
    The JSM-5800LV is a versatile, high-performance scanning electron microscope. It delivers a high resolution of 3.5nm, and 5.5nm in Low Vacuum (LV) mode, which is ideal for observing specimens with high water content or non-conductive surfaces. The microscope’s specimen chamber can hold up to an 8-inch diameter specimen and offers automated features like Auto Focus/Stigmator and Automatic Contrast/Brightness. It provides a user-friendly interface with two 12-inch CTRs for high-quality digital imaging. Additional features include color display for secondary electron and backscattered electron images, a fully automated five-axis eucentric specimen stage, digital raster rotation, and on-board image archiving. The JSM-5800LV is widely used across various applications and offers numerous options for increased versatility.
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    類別
    SEM / FIB

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    129226


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    JEOL

    JSM-5800LV

    verified-listing-icon
    已驗證
    類別
    SEM / FIB
    上次驗證: 超過30天前
    listing-photo-a17b2b9979f14d568f9374c451f3fdc5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44424/a17b2b9979f14d568f9374c451f3fdc5/3fe2b813c2a34a8cab4e0c767b9cfdd7_ee8e7d0067f74f35bcbda69c68640fcf1201a_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    129226


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    turbo pumped, 5 axis motorized stage, SE and backscatter detectors, medium sized chamber, tungsten filament, variable pressure/low vacuum
    配置
    無配置
    OEM 代工型號說明
    The JSM-5800LV is a versatile, high-performance scanning electron microscope. It delivers a high resolution of 3.5nm, and 5.5nm in Low Vacuum (LV) mode, which is ideal for observing specimens with high water content or non-conductive surfaces. The microscope’s specimen chamber can hold up to an 8-inch diameter specimen and offers automated features like Auto Focus/Stigmator and Automatic Contrast/Brightness. It provides a user-friendly interface with two 12-inch CTRs for high-quality digital imaging. Additional features include color display for secondary electron and backscattered electron images, a fully automated five-axis eucentric specimen stage, digital raster rotation, and on-board image archiving. The JSM-5800LV is widely used across various applications and offers numerous options for increased versatility.
    文檔

    無文檔