描述
無描述配置
Resolution: 3 nm @ 30kV (SEI), 5 nm @ 30kV (BEI) Sample: 8" max., 125 mm X, 100 mm Y Options:X-SIS, EDS, IR Camera, 8" ChamberOEM 代工型號說明
未提供文檔
無文檔
JEOL
JSM 5900LV
已驗證
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
12079
晶圓尺寸:
8"/200mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM 5900LV
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
12079
晶圓尺寸:
8"/200mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Resolution: 3 nm @ 30kV (SEI), 5 nm @ 30kV (BEI) Sample: 8" max., 125 mm X, 100 mm Y Options:X-SIS, EDS, IR Camera, 8" ChamberOEM 代工型號說明
未提供文檔
無文檔