描述
It is a 200kV spherical aberration-corrected transmission electron microscope designed for ultra-high resolution and low voltage imaging. It enables sub-angstrom level atomic observations in materials science, semiconductor and soft matter research, while minimizing beam damage. Hitachi HD-2700 Scanning Transmission Electron Microscope EDS Spectrometer (Energy-Dispersive X-ray Spectrometer) Annular Dark-Field (ADF) Detector Bright-Field (BF) Detector Secondary Electron (SE) Detector (enables atomic-resolution SEM imaging) Sample Stage / Holders MEMS-based In-situ Heating / Biasing Holder Double-Tilt Holder Plan-view Holder Hitachi Focused Ion Beam (FIB) Compatible Holder配置
無配置OEM 代工型號說明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.文檔
無文檔
HITACHI
HD-2700
類別
SEM / FIB
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151852
晶圓尺寸:
未知
年份:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
It is a 200kV spherical aberration-corrected transmission electron microscope designed for ultra-high resolution and low voltage imaging. It enables sub-angstrom level atomic observations in materials science, semiconductor and soft matter research, while minimizing beam damage. Hitachi HD-2700 Scanning Transmission Electron Microscope EDS Spectrometer (Energy-Dispersive X-ray Spectrometer) Annular Dark-Field (ADF) Detector Bright-Field (BF) Detector Secondary Electron (SE) Detector (enables atomic-resolution SEM imaging) Sample Stage / Holders MEMS-based In-situ Heating / Biasing Holder Double-Tilt Holder Plan-view Holder Hitachi Focused Ion Beam (FIB) Compatible Holder配置
無配置OEM 代工型號說明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.文檔
無文檔