描述
Under Service Contract Gun tip will be replaced prior to sale.配置
Aberration-corrected scanning transmission electron microscope (STEM) EDS detector - SDD based and does not need LN ADF detector Bright field detector Secondary electron detector (enabling atomic-resolution SEM imaging) In-situ heating/biasing MEMS-based holder Double-tilt holder Plan-view sample holder Hitachi FIB-compatible holderOEM 代工型號說明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.文檔
無文檔
HITACHI
HD-2700
類別
SEM / FIB
上次驗證: 3 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
133588
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Under Service Contract Gun tip will be replaced prior to sale.配置
Aberration-corrected scanning transmission electron microscope (STEM) EDS detector - SDD based and does not need LN ADF detector Bright field detector Secondary electron detector (enabling atomic-resolution SEM imaging) In-situ heating/biasing MEMS-based holder Double-tilt holder Plan-view sample holder Hitachi FIB-compatible holderOEM 代工型號說明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.文檔
無文檔