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HITACHI S-4800
    描述
    The Hitachi 4800-I is equipped with a cold FEG emitter, high vacuum, 25mm XY stage, 4” load lock entry, and ODP vacuum.
    配置
    無配置
    OEM 代工型號說明
    The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.
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    已驗證

    類別
    SEM / FIB

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    112330


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    HITACHI

    S-4800

    verified-listing-icon
    已驗證
    類別
    SEM / FIB
    上次驗證: 超過60天前
    listing-photo-14a15c325c3e4778a21a3f7fc122c169-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43793/14a15c325c3e4778a21a3f7fc122c169/454c115fa44c42b9993b171ce24dd079_1491901302_mw.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    112330


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    The Hitachi 4800-I is equipped with a cold FEG emitter, high vacuum, 25mm XY stage, 4” load lock entry, and ODP vacuum.
    配置
    無配置
    OEM 代工型號說明
    The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.
    文檔

    無文檔